Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831000 | Testing electronic memories based on fault and test algorithm periodicity | Aram Hakhumyan, Gurgen Harutyunyan, Samvel Shoukourian, Valery Vardanian | 2017-11-28 |
| 9541591 | Periodic signal measurement using statistical sampling | Karen Darbinyan, Arun Kumar, Mher Mkhoyan | 2017-01-10 |