Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831000 | Testing electronic memories based on fault and test algorithm periodicity | Aram Hakhumyan, Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian | 2017-11-28 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831000 | Testing electronic memories based on fault and test algorithm periodicity | Aram Hakhumyan, Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian | 2017-11-28 |