Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9568550 | Identifying failure indicating scan test cells of a circuit-under-test | Parthajit Bhattacharya, Rohit Kapur | 2017-02-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9568550 | Identifying failure indicating scan test cells of a circuit-under-test | Parthajit Bhattacharya, Rohit Kapur | 2017-02-14 |