Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9588179 | Scheme for masking output of scan chains in test circuit | Jyotirmoy Saikia | 2017-03-07 |
| 9568550 | Identifying failure indicating scan test cells of a circuit-under-test | Subhadip Kundu, Parthajit Bhattacharya | 2017-02-14 |