SM

Stephen F. Meier

D2 D2S: 1 patents #2 of 5Top 40%
Overall (2017): #233,742 of 506,227Top 50%
1
Patents 2017

Issued Patents 2017

Patent #TitleCo-InventorsDate
9612530 Method and system for design of enhanced edge slope patterns for charged particle beam lithography Akira Fujimura, Kazuyuki Hagiwara, Ingo Bork 2017-04-04