Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9842779 | Method of evaluating metal contamination in semiconductor wafer and method of manufacturing semiconductor wafer | Kei Matsumoto, Kazutaka Eriguchi, Tsuyoshi Kubota | 2017-12-12 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9842779 | Method of evaluating metal contamination in semiconductor wafer and method of manufacturing semiconductor wafer | Kei Matsumoto, Kazutaka Eriguchi, Tsuyoshi Kubota | 2017-12-12 |