Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9842779 | Method of evaluating metal contamination in semiconductor wafer and method of manufacturing semiconductor wafer | Kei Matsumoto, Kazutaka Eriguchi, Noritomo Mitsugi | 2017-12-12 |
| D777891 | Air conditioner | Keiichi Yamamoto, Tomoki Hayashi, Hiroyuki Masuda, Shinya Morikawa, Akihiro Hasegawa +1 more | 2017-01-31 |
| D777895 | Air conditioner | Akihiro Hasegawa, Junki Oonishi | 2017-01-31 |