Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9698063 | Method of testing a semiconductor-on-insulator structure and application of said test to the fabrication of such a structure | Patrick Reynaud, Konstantin Bourdelle, Jean Gilbert | 2017-07-04 |
| 9576798 | Method for fabricating semiconductor layers including transistor channels having different strain states, and related semiconductor layers | Bich-Yen Nguyen, Christophe Maleville | 2017-02-21 |