Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9698063 | Method of testing a semiconductor-on-insulator structure and application of said test to the fabrication of such a structure | Patrick Reynaud, Walter Schwarzenbach, Konstantin Bourdelle | 2017-07-04 |