Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9829442 | Defect inspecting method, sorting method and producing method for photomask blank | Tsuneo Terasawa, Atsushi YOKOHATA, Takahiro KISHITA, Hiroshi Fukuda | 2017-11-28 |
| 9829787 | Defect inspecting method, sorting method, and producing method for photomask blank | Tsuneo Terasawa, Hiroshi Fukuda, Takahiro KISHITA, Atsushi YOKOHATA | 2017-11-28 |
| 9772551 | Evaluation method of defect size of photomask blank, selection method, and manufacturing method | Tsuneo Terasawa, Takahiro KISHITA, Hiroshi Fukuda, Atsushi YOKOHATA | 2017-09-26 |
| 9761326 | Memory system and memory control method | Yu Nakanishi, Kiwamu Watanabe, Kenji Funaoka, Tetsuya Sunata, Keigo Hara +1 more | 2017-09-12 |
| 9575887 | Memory device, information-processing device and information-processing method | Shoji Sawamura, Nobuhiro Kondo, Takaya Horiki | 2017-02-21 |