Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823271 | Semiconductor testing structures and semiconductor testing apparatus | Nan Li, Ling Zhu | 2017-11-21 |
| 9606173 | In-chip static-current device failure detecting methods and apparatus | Jianfeng Pan | 2017-03-28 |
| 9557348 | Semiconductor testing structures and fabrication method thereof | Nan Li, Ling Zhu | 2017-01-31 |