Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823271 | Semiconductor testing structures and semiconductor testing apparatus | Nan Li, Lilung Lai | 2017-11-21 |
| 9557348 | Semiconductor testing structures and fabrication method thereof | Nan Li, Lilung Lai | 2017-01-31 |