Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9651607 | Photo device inspection apparatus and photo device inspection method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2017-05-16 |
| 9541508 | Inspecting device and inspecting method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2017-01-10 |