Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9766132 | Measuring apparatus and measuring method | Yasuhiro Takase, Motohiro Kono, Kazuo Kinose | 2017-09-19 |
| 9759656 | Inspection apparatus and inspection method | Akira Ito, Toshimitsu Mochizuki, Hidetaka Takato, Katsuhiko Shirasawa | 2017-09-12 |
| 9651607 | Photo device inspection apparatus and photo device inspection method | Akira Ito, Iwao Kawayama, Masayoshi Tonouchi | 2017-05-16 |
| 9541508 | Inspecting device and inspecting method | Akira Ito, Masayoshi Tonouchi, Iwao Kawayama | 2017-01-10 |