Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9830998 | Stress patterns to detect shorts in three dimensional non-volatile memory | Jayavel Pachamuthu, Ankitkumar Babariya, Jagdish Sabde | 2017-11-28 |
| 9653175 | Determination of word line to word line shorts between adjacent blocks | Jagdish Sabde, Khanh Nguyen | 2017-05-16 |
| 9564219 | Current based detection and recording of memory hole-interconnect spacing defects | Jagdish Sabde, Jayavel Pachamuthu, Ankitkumar Babariya | 2017-02-07 |
| 9548129 | Word line look ahead read for word line to word line short detection | Rajan Paudel, Jagdish Sabde, Mrinal Kochar | 2017-01-17 |