Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846359 | Diffraction-based overlay marks and methods of overlay measurement | Seung Yoon Lee, Jeong Jin Lee | 2017-12-19 |
SO
Seung Hwa Oh
Overall (2017): #248,226 of 506,227Top 50%
1
Patents 2017