Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846359 | Diffraction-based overlay marks and methods of overlay measurement | Seung Hwa Oh, Seung Yoon Lee | 2017-12-19 |
JL
Jeong Jin Lee
Overall (2017): #379,888 of 506,227Top 80%
1
Patents 2017