Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9665795 | Method and apparatus for identifying root cause of defect using composite defect map | Min Kyun Doo | 2017-05-30 |
| 9652836 | Defect cell clustering method and apparatus thereof | Dae Jung AHN, Ji Young Park, Ji Min KANG | 2017-05-16 |
| 9547544 | Method for verifying bad pattern in time series sensing data and apparatus thereof | Dae Jung AHN, Dae Hong SEO, Woo-Young Jung | 2017-01-17 |