Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9652836 | Defect cell clustering method and apparatus thereof | Kae Young SHIN, Ji Young Park, Ji Min KANG | 2017-05-16 |
| 9547544 | Method for verifying bad pattern in time series sensing data and apparatus thereof | Kae Young SHIN, Dae Hong SEO, Woo-Young Jung | 2017-01-17 |