| 9837140 |
Semiconductor device |
Atsushi Miyanishi, Kazumasa Yanagisawa |
2017-12-05 |
| 9830980 |
Semiconductor device, test program, and test method |
Atsushi Miyanishi, Yoshisato Yokoyama |
2017-11-28 |
| 9805821 |
Semiconductor memory device and test method therefor |
Shinji Tanaka, Masaki Tsukude, Yoshikazu Saito |
2017-10-31 |
| 9798600 |
Semiconductor memory device |
Atsushi Miyanishi, Yoshikazu Saito |
2017-10-24 |
| 9728272 |
Semiconductor device, test program, and test method |
Atsushi Miyanishi, Yoshisato Yokoyama |
2017-08-08 |
| 9721647 |
Semiconductor device |
— |
2017-08-01 |
| 9711208 |
Semiconductor storage device with reduced current in standby mode |
Yoshisato Yokoyama |
2017-07-18 |
| 9704566 |
SRAM with first and second precharge circuits |
— |
2017-07-11 |
| 9685225 |
Semiconductor storage device for controlling word lines independently of power-on sequence |
— |
2017-06-20 |
| 9559693 |
Semiconductor device |
Atsushi Miyanishi, Kazumasa Yanagisawa |
2017-01-31 |