Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9830980 | Semiconductor device, test program, and test method | Atsushi Miyanishi, Yuichiro Ishii | 2017-11-28 |
| 9728272 | Semiconductor device, test program, and test method | Atsushi Miyanishi, Yuichiro Ishii | 2017-08-08 |
| 9711208 | Semiconductor storage device with reduced current in standby mode | Yuichiro Ishii | 2017-07-18 |