Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE46350 | Method for stem sample inspection in a charged particle beam instrument | Lyudmila Zaykova-Feldman, Thomas M. Moore, Gonzalo Amador | 2017-03-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE46350 | Method for stem sample inspection in a charged particle beam instrument | Lyudmila Zaykova-Feldman, Thomas M. Moore, Gonzalo Amador | 2017-03-28 |