Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE46350 | Method for stem sample inspection in a charged particle beam instrument | Thomas M. Moore, Gonzalo Amador, Matthew Hammer | 2017-03-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE46350 | Method for stem sample inspection in a charged particle beam instrument | Thomas M. Moore, Gonzalo Amador, Matthew Hammer | 2017-03-28 |