SK

Shi Surk Kim

NC Nano Cms Co.: 1 patents #1 of 4Top 25%
Overall (2017): #244,741 of 506,227Top 50%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9644956 Method and apparatus for measuring thin film thickness using x-ray Joo Hye Kim, Sang-Bong Lee, Seong Uk Lee 2017-05-09