Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9644956 | Method and apparatus for measuring thin film thickness using x-ray | Shi Surk Kim, Joo Hye Kim, Sang-Bong Lee | 2017-05-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9644956 | Method and apparatus for measuring thin film thickness using x-ray | Shi Surk Kim, Joo Hye Kim, Sang-Bong Lee | 2017-05-09 |