Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9715992 | Integrated optical and charged particle inspection apparatus | Jacob Pieter Hoogenboom, Pieter Kruit, Nalan Liv | 2017-07-25 |
| 9607806 | Charged particle multi-beam apparatus including a manipulator device for manipulation of one or more charged particle beams | Pieter Kruit | 2017-03-28 |