Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9625520 | Latch-up test device and method for testing wafer under test | Shih-Yu Wang, Yao-Wen Chang | 2017-04-18 |
| 9565570 | Capacity planning method and device for wireless broadband network | Hai Zhang, Jun Gu, Jing Qi, Jun Yan, Xi Chen +4 more | 2017-02-07 |