Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9714905 | Wafer inspection recipe setup | Martin Plihal, Deepak Gupta, Premkumar Vijayaraman, Lakshman Deenadayalan | 2017-07-25 |
| 9582869 | Dynamic binning for diversification and defect discovery | Martin Plihal | 2017-02-28 |