Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835566 | Adaptive nuisance filter | Ardis Liang, Raghav Babulnath, Sankar Venkataraman | 2017-12-05 |
| 9714905 | Wafer inspection recipe setup | Deepak Gupta, Vidyasagar Anantha, Premkumar Vijayaraman, Lakshman Deenadayalan | 2017-07-25 |
| 9613411 | Creating defect classifiers and nuisance filters | Raghavan Konuru, Naema Bhatti, Michael Lennek | 2017-04-04 |
| 9582869 | Dynamic binning for diversification and defect discovery | Vidyasagar Anantha | 2017-02-28 |