Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841512 | System and method for reducing radiation-induced false counts in an inspection system | Ximan Jiang, Christian Wolters, Stephen Biellak, Mous Tatarkhanov | 2017-12-12 |
| 9810619 | Method and system for simultaneous tilt and height control of a substrate surface in an inspection system | Zhongping Cai, Jingyi Xiong, Tyler Trytko, Alexander Slobodov, Paul Doyle | 2017-11-07 |
| 9678350 | Laser with integrated multi line or scanning beam capability | Christian Wolters, Jijen Vazhaeparambil, Dirk Woll, Bret Whiteside, Stephen Biellak +1 more | 2017-06-13 |
| 9587936 | Scanning inspection system with angular correction | Yury Yuditsky, Alexander Slobodov | 2017-03-07 |