Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846928 | Inspection method and inspection apparatus | Riki Ogawa | 2017-12-19 |
| 9746140 | LED lighting device | Hiroshi Ohno, Mitsuaki Kato, Katsumi Hisano, Yoshinori Honguh, Masataka Shiratsuchi +3 more | 2017-08-29 |
| 9683947 | Defect inspection device | Riki Ogawa, Takeshi Fujiwara | 2017-06-20 |