Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9816944 | Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation method | Aya Miki, Toshihiro Kugimiya, Nobuyuki Kawakami | 2017-11-14 |
| 9780005 | Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film | Nobuyuki Kawakami, Toshihiro Kugimiya, Mototaka Ochi | 2017-10-03 |
| 9583633 | Oxide for semiconductor layer of thin film transistor, thin film transistor and display device | Byung Du Ahn, Gun Hee Kim, Yeon Hong Kim, Jin Hyun Park, Shuji Kosaka | 2017-02-28 |