Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791465 | Automatic analyzer | Yukinori Sakashita, Katsuhiro Kambara | 2017-10-17 |
| 9625273 | Thickness measurement apparatus and method thereof | Hidehiko Kuroda, Akio Sumita | 2017-04-18 |
| 9557326 | Sample analyzing device and sample analyzing method | Toru Inaba, Shinya Matsuoka, Taku Sakazume, Masafumi Shimada, Osamu Kogi +1 more | 2017-01-31 |