| 9837142 |
Automated stressing and testing of semiconductor memory cells |
Michael Kugel, Stefan Payer, Wolfgang Penth, Juergen Pille, Tobias Werner |
2017-12-05 |
| 9805823 |
Automated stressing and testing of semiconductor memory cells |
Michael Kugel, Stefan Payer, Wolfgang Penth, Juergen Pille, Tobias Werner |
2017-10-31 |
| 9792967 |
Managing semiconductor memory array leakage current |
Paul A. Bunce, John D. Davis, Silke Penth, David Edward Schmitt, Tobias Werner +1 more |
2017-10-17 |
| 9786339 |
Dual mode operation having power saving and active modes in a stacked circuit topology with logic preservation |
Paul A. Bunce, John D. Davis, Silke Penth, David Edward Schmitt, Tobias Werner +1 more |
2017-10-10 |
| 9761289 |
Managing semiconductor memory array leakage current |
Paul A. Bunce, John D. Davis, Silke Penth, David Edward Schmitt, Tobias Werner +1 more |
2017-09-12 |
| 9742408 |
Dynamic decode circuit with active glitch control |
Paul A. Bunce, John D. Davis, Antonio R. Pelella |
2017-08-22 |
| 9711244 |
Memory circuit |
Silke Penth, David Edward Schmitt, Tobias Werner |
2017-07-18 |
| 9537474 |
Transforming a phase-locked-loop generated chip clock signal to a local clock signal |
Juergen Pille, Rolf Sautter, Tobias Werner |
2017-01-03 |
