| 9837142 |
Automated stressing and testing of semiconductor memory cells |
Yuen H. Chan, Michael Kugel, Stefan Payer, Wolfgang Penth, Tobias Werner |
2017-12-05 |
| 9805823 |
Automated stressing and testing of semiconductor memory cells |
Yuen H. Chan, Michael Kugel, Stefan Payer, Wolfgang Penth, Tobias Werner |
2017-10-31 |
| 9761286 |
Current-mode sense amplifier |
Alexander Fritsch, Michael Kugel, Dieter Wendel |
2017-09-12 |
| 9704567 |
Stressing and testing semiconductor memory cells |
Michael Kugel, Stefan Payer, Wolfgang Penth |
2017-07-11 |
| 9595304 |
Current-mode sense amplifier |
Alexander Fritsch, Ulrich Krauch, Michael Kugel |
2017-03-14 |
| 9589604 |
Single ended bitline current sense amplifier for SRAM applications |
Alexander Fritsch, Shankar Kalyanasundaram, Michael Kugel |
2017-03-07 |
| 9552851 |
Current-mode sense amplifier |
Alexander Fritsch, Michael Kugel, Dieter Wendel |
2017-01-24 |
| 9537474 |
Transforming a phase-locked-loop generated chip clock signal to a local clock signal |
Yuen H. Chan, Rolf Sautter, Tobias Werner |
2017-01-03 |
