| 9837142 |
Automated stressing and testing of semiconductor memory cells |
Yuen H. Chan, Michael Kugel, Stefan Payer, Wolfgang Penth, Juergen Pille |
2017-12-05 |
| 9805823 |
Automated stressing and testing of semiconductor memory cells |
Yuen H. Chan, Michael Kugel, Stefan Payer, Wolfgang Penth, Juergen Pille |
2017-10-31 |
| 9792967 |
Managing semiconductor memory array leakage current |
Paul A. Bunce, Yuen H. Chan, John D. Davis, Silke Penth, David Edward Schmitt +1 more |
2017-10-17 |
| 9786339 |
Dual mode operation having power saving and active modes in a stacked circuit topology with logic preservation |
Paul A. Bunce, Yuen H. Chan, John D. Davis, Silke Penth, David Edward Schmitt +1 more |
2017-10-10 |
| 9761289 |
Managing semiconductor memory array leakage current |
Paul A. Bunce, Yuen H. Chan, John D. Davis, Silke Penth, David Edward Schmitt +1 more |
2017-09-12 |
| 9711244 |
Memory circuit |
Yuen H. Chan, Silke Penth, David Edward Schmitt |
2017-07-18 |
| 9627090 |
RAM at speed flexible timing and setup control |
Martin Eckert, Michael Kugel, Otto A. Torreiter |
2017-04-18 |
| 9627017 |
RAM at speed flexible timing and setup control |
Martin Eckert, Michael Kugel, Otto A. Torreiter |
2017-04-18 |
| 9537474 |
Transforming a phase-locked-loop generated chip clock signal to a local clock signal |
Yuen H. Chan, Juergen Pille, Rolf Sautter |
2017-01-03 |
