Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791502 | On-chip usable life depletion meter and associated method | Jeanne P. Bickford, Nazmul Habib, Baozhen Li | 2017-10-17 |
| 9639645 | Integrated circuit chip reliability using reliability-optimized failure mechanism targeting | Jeanne P. Bickford, Nazmul Habib, Baozhen Li | 2017-05-02 |
| 9625325 | System and method for identifying operating temperatures and modifying of integrated circuits | Jeanne P. Bickford, Nazmul Habib, Baozhen Li | 2017-04-18 |
| 9618566 | Systems and methods to prevent incorporation of a used integrated circuit chip into a product | Jeanne P. Bickford, Nazmul Habib, Baozhen Li | 2017-04-11 |