Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9759546 | Method for measuring thickness variations in a layer of a multilayer semiconductor structure | Didier Dutartre | 2017-09-12 |
| 9679777 | Process, stack and assembly for separating a structure from a substrate by electromagnetic radiation | Yann Sinquin, Jean-Marc Bethoux | 2017-06-13 |
| 9679799 | Process for fabricating a semiconductor-on-insulator substrate | Christophe Gourdel | 2017-06-13 |
| 9589830 | Method for transferring a useful layer | Didier Landru, Nadia Ben Mohamed, Damien Massy, Frédéric Mazen, Francois Rieutord | 2017-03-07 |
| 9548237 | Method for transferring a layer comprising a compressive stress layer and related structures | Gweltaz Gaudin, Ionut Radu | 2017-01-17 |