Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9759546 | Method for measuring thickness variations in a layer of a multilayer semiconductor structure | Oleg Kononchuk | 2017-09-12 |
| 9711550 | Pinned photodiode with a low dark current | Laurent Favennec, Francois Roy | 2017-07-18 |
| 9704903 | Front-side imager having a reduced dark current on SOI substrate | — | 2017-07-11 |