KP

Kerry P. Pfarr

Globalfoundries: 1 patents #454 of 1,311Top 35%
Overall (2017): #347,520 of 506,227Top 70%
1
Patents 2017

Issued Patents 2017

Patent #TitleCo-InventorsDate
9599664 Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures Luke D. LaCroix, Mark C. Lamorey, Steven F. Oakland, Janak G. Patel, Peter Slota, Jr. +1 more 2017-03-21