Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9599664 | Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures | Mark C. Lamorey, Steven F. Oakland, Janak G. Patel, Kerry P. Pfarr, Peter Slota, Jr. +1 more | 2017-03-21 |