Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678142 | Two-step interconnect testing of semiconductor dies | Julien Ryckaert, Erik Jan Marinissen | 2017-06-13 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678142 | Two-step interconnect testing of semiconductor dies | Julien Ryckaert, Erik Jan Marinissen | 2017-06-13 |