Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678142 | Two-step interconnect testing of semiconductor dies | Julien Ryckaert, Dimitri Linten | 2017-06-13 |
| 9568536 | Transition delay detector for interconnect test | Sandeep Kumar Goel | 2017-02-14 |