Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9773570 | Built-in-self-test (BIST) test time reduction | Kevin W. Gorman, Krishnendu Mondal, Michael R. Ouellette | 2017-09-26 |
| 9761329 | Built-in self-test (BIST) circuit and associated BIST method for embedded memories | Aravindan J. Busi, Krishnendu Mondal, Michael R. Ouellette | 2017-09-12 |
| 9715942 | Built-in self-test (BIST) circuit and associated BIST method for embedded memories | Aravindan J. Busi, Krishnendu Mondal, Michael R. Ouellette | 2017-07-25 |