Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778205 | Delta die and delta database inspection | Yanwei Liu, Yalin Xiong | 2017-10-03 |
| 9710903 | System and method for detecting design and process defects on a wafer using process monitoring features | Christophe David Fouquet, Zain Saidin, Sergio Edelstein, Savitha Nanjangud | 2017-07-18 |