Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9710903 | System and method for detecting design and process defects on a wafer using process monitoring features | Zain Saidin, Sergio Edelstein, Savitha Nanjangud, Carl Hess | 2017-07-18 |