Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780803 | Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit | Chandrajit Debnath, Neha Bhargava | 2017-10-03 |
| 9685150 | Noise removal system | Anupam Jain, Rakhel Kumar Parida | 2017-06-20 |