Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780803 | Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit | Ankur Bal, Chandrajit Debnath | 2017-10-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780803 | Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit | Ankur Bal, Chandrajit Debnath | 2017-10-03 |