Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9829538 | IC expected data and mask data on I/O data pads | Lee D. Whetsel | 2017-11-28 |
| 9702935 | Packet based integrated circuit testing | Lewis Nardini, Sumant Dinkar Kale | 2017-07-11 |
| 9562946 | Integrated circuit wafer having plural dies with each die including test circuit receiving expected data and mask data from different pads | Lee D. Whetsel | 2017-02-07 |