SM

Shyam Mohan

IK Indian Institute Of Technology Kanpur: 1 patents #5 of 18Top 30%
Overall (2017): #243,638 of 506,227Top 50%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9778202 Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample Satyajit Banerjee, Jaivardhan Sinha 2017-10-03